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Trinocular Polarizing Microscope RPL-55T Trinocular Polarizing Microscope RPL-55T Trinocular Polarizing Microscope RPL-55T Trinocular Polarizing Microscope RPL-55T

Trinocular Polarizing Microscope RPL-55T

90000.0 INR

Product Details:

  • Operate Method MANUAL
  • Material Die Casting
  • Color OFF White
  • Product Type TABLE TOP
  • Application Geology, Petrography & Crystal Fibers
  • Classification MANUAL
  • Usage Geology & Petrography for Study of Rock & Mineral
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Trinocular Polarizing Microscope RPL-55T Price And Quantity

  • 65000.00 - 85000.00 INR
  • 1
  • 90000.0 INR

Trinocular Polarizing Microscope RPL-55T Product Specifications

  • Other
  • full stroke range 30mm
  • Trincouar
  • PL4X, N.A. 0.10, W.D. 30mmDIN achromatic, unbreakable container for storage
  • MANUAL
  • NA
  • Trinocular
  • DIN Achromatic PL 4x, 10x, 40x
  • NA
  • NA
  • Die Casting
  • OFF White
  • NA
  • fine adjustment 2.5m/Div
  • 48mm-75mm Millimeter (mm)
  • TABLE TOP
  • Geology, Petrography & Crystal Fibers
  • Paired, WF 10X, FOV-20mm
  • MANUAL
  • NA
  • Parfocal (45mm) Millimeter (mm)
  • Halogen and LED
  • NA
  • Trincoular
  • Transmitted Illumination
  • Geology & Petrography for Study of Rock & Mineral
  • Centerable Abbe Condenser
  • NA

Trinocular Polarizing Microscope RPL-55T Trade Information

  • 50 Per Month
  • 2 Week
  • Contact us for information regarding our sample policy
  • Export Worthy Cartons
  • Asia, Australia, Central America, North America, South America, Eastern Europe, Western Europe, Middle East, Africa
  • All India
  • An ISO 9001:2015, 14001:2015, 13485:2016, FDA, WHO-GMP, CE, & BIS Certified Company

Product Description

Research Polarizing Microscope RPL-55T is a principal piece of equipment used by the geologists to observe the optical properties of minerals. It has indispensable applications for Petrography, Crystallography, Geology, Mineralogy, Ceramics, Toxicology, Chemical Microscopy or detecting defects in semiconductors or finding stress points in metal, glass & textiles, etc. It permits orthoscopically or conoscopically to examine and identify the strutrues/characterstics of material with highly resolved distinctive images under various magnifications.

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